Testing Superconductor Logic Integrated Circuits

A.J. Arun, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Digest of Papers of the IEEE European Test Symposium (ETS)
Place of Publication	Tallinn, Estonia
Pages	239-244
Number of pages	6
Publication status	Published - 1 May 2005
Event	10th IEEE European Test Symposium, ETS 2005 - Tallinn, Estonia Duration: 22 May 2005 → 25 May 2005 Conference number: 10

Conference	10th IEEE European Test Symposium, ETS 2005
Abbreviated title	ETS
Country/Territory	Estonia
City	Tallinn
Period	22/05/05 → 25/05/05

Keywords

@inproceedings{bca13cef7adf40deb2c952148d1e1445,

title = "Testing Superconductor Logic Integrated Circuits",

keywords = "METIS-226919",

author = "A.J. Arun and Kerkhoff, \{Hans G.\}",

year = "2005",

month = may,

day = "1",

language = "Undefined",

pages = "239--244",

booktitle = "Digest of Papers of the IEEE European Test Symposium (ETS)",

note = "10th IEEE European Test Symposium, ETS 2005 ; Conference date: 22-05-2005 Through 25-05-2005",

}

TY - GEN

T1 - Testing Superconductor Logic Integrated Circuits

AU - Arun, A.J.

AU - Kerkhoff, Hans G.

N1 - Conference code: 10

PY - 2005/5/1

Y1 - 2005/5/1

KW - METIS-226919

M3 - Conference contribution

SP - 239

EP - 244

BT - Digest of Papers of the IEEE European Test Symposium (ETS)

CY - Tallinn, Estonia

T2 - 10th IEEE European Test Symposium, ETS 2005

Y2 - 22 May 2005 through 25 May 2005

ER -