Testing Timed Automata

Jan Springintveld, Frits Vaandrager, P.R. d' Argenio

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    Abstract

    We present a generalization of the classical theory of testing for Mealy machines to a setting of dense real-time systems. A model of timed I/O automata is introduced, inspired by the timed automaton model of Alur and Dill, together with a notion of test sequence for this model. Our main contribution is a test generation algorithm for black-box conformance testing of timed I/O automata. Although it is highly exponential and cannot be claimed to be of practical value, it is the �rst algorithm that yields a �nite and complete set of tests for dense real-time systems.
    Original languageUndefined
    Place of PublicationEnschede
    PublisherCentre for Telematics and Information Technology (CTIT)
    Number of pages24
    Publication statusPublished - Sept 1997

    Publication series

    NameCTIT Technical Report Series
    No.97-17
    ISSN (Print)1381-3625

    Keywords

    • IR-18593
    • EWI-6020
    • METIS-119114

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