Texture analysis of RTCVD Poly-Si layers

I. Barsony, J.G.E. Klappe, Hans Wallinga

    Research output: Contribution to conferencePoster

    Original languageUndefined
    Pages-
    Publication statusPublished - 19 Nov 1991
    EventIOP/FOM Werkgemeenschap Halfgeleiders 1991 - Veldhoven, Netherlands
    Duration: 19 Nov 199120 Nov 1991

    Conference

    ConferenceIOP/FOM Werkgemeenschap Halfgeleiders 1991
    CountryNetherlands
    CityVeldhoven
    Period19/11/9120/11/91

    Keywords

    • METIS-117171

    Cite this

    Barsony, I., Klappe, J. G. E., & Wallinga, H. (1991). Texture analysis of RTCVD Poly-Si layers. -. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.
    Barsony, I. ; Klappe, J.G.E. ; Wallinga, Hans. / Texture analysis of RTCVD Poly-Si layers. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.
    @conference{fa0300fdc1ee4b9aa48db690c6e1d711,
    title = "Texture analysis of RTCVD Poly-Si layers",
    keywords = "METIS-117171",
    author = "I. Barsony and J.G.E. Klappe and Hans Wallinga",
    year = "1991",
    month = "11",
    day = "19",
    language = "Undefined",
    pages = "--",
    note = "null ; Conference date: 19-11-1991 Through 20-11-1991",

    }

    Barsony, I, Klappe, JGE & Wallinga, H 1991, 'Texture analysis of RTCVD Poly-Si layers' IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands, 19/11/91 - 20/11/91, pp. -.

    Texture analysis of RTCVD Poly-Si layers. / Barsony, I.; Klappe, J.G.E.; Wallinga, Hans.

    1991. - Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.

    Research output: Contribution to conferencePoster

    TY - CONF

    T1 - Texture analysis of RTCVD Poly-Si layers

    AU - Barsony, I.

    AU - Klappe, J.G.E.

    AU - Wallinga, Hans

    PY - 1991/11/19

    Y1 - 1991/11/19

    KW - METIS-117171

    M3 - Poster

    SP - -

    ER -

    Barsony I, Klappe JGE, Wallinga H. Texture analysis of RTCVD Poly-Si layers. 1991. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.