The Application of a Square-Wave Supply Voltage to Detect Small Delay Faults in High-Speed Digital Circuits

H.J. Vermaak; H.G. Kerkhoff

The Application of a Square-Wave Supply Voltage to Detect Small Delay Faults in High-Speed Digital Circuits

H.J. Vermaak
, H.G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

High-performance digital circuits with aggressive timing constraints are usually very susceptible to delay faults. Much research done on delay fault detection needs a rather complicated test setup together with precise test clock requirements. In this paper, we propose a test technique based on the digital oscillation test method. The technique, which was simulated in software, consists of sensitizing a critical path in the digital circuit under test and incorporating the path into an oscillation ring. The supply voltage to the oscillation ring is then varied to detect delay and stuck-at faults in the path.

Original language	English
Title of host publication	Proceeding Annual Workshop on Circuits, Systems and Signal Processing, ProRISC 2002
Publisher	STW
Pages	520-525
Number of pages	6
ISBN (Print)	90-73461-33-2
Publication status	Published - 28 Nov 2002
Event	13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002 - Veldhoven, Netherlands Duration: 28 Nov 2002 → 29 Nov 2002 Conference number: 13

Workshop

Workshop	13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002
Country/Territory	Netherlands
City	Veldhoven
Period	28/11/02 → 29/11/02

Keywords

Delay fault testing
Oscillation test method
Low-voltage supply testing

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@inproceedings{a7c09eadbfed48e5871a6053e75badac,

title = "The Application of a Square-Wave Supply Voltage to Detect Small Delay Faults in High-Speed Digital Circuits",

abstract = "High-performance digital circuits with aggressive timing constraints are usually very susceptible to delay faults. Much research done on delay fault detection needs a rather complicated test setup together with precise test clock requirements. In this paper, we propose a test technique based on the digital oscillation test method. The technique, which was simulated in software, consists of sensitizing a critical path in the digital circuit under test and incorporating the path into an oscillation ring. The supply voltage to the oscillation ring is then varied to detect delay and stuck-at faults in the path.",

keywords = "Delay fault testing, Oscillation test method, Low-voltage supply testing",

author = "H.J. Vermaak and H.G. Kerkhoff",

year = "2002",

month = nov,

day = "28",

language = "English",

isbn = "90-73461-33-2",

pages = "520--525",

booktitle = "Proceeding Annual Workshop on Circuits, Systems and Signal Processing, ProRISC 2002",

publisher = "STW",

note = "13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002 ; Conference date: 28-11-2002 Through 29-11-2002",

}

TY - GEN

T1 - The Application of a Square-Wave Supply Voltage to Detect Small Delay Faults in High-Speed Digital Circuits

AU - Vermaak, H.J.

AU - Kerkhoff, H.G.

N1 - Conference code: 13

PY - 2002/11/28

Y1 - 2002/11/28

N2 - High-performance digital circuits with aggressive timing constraints are usually very susceptible to delay faults. Much research done on delay fault detection needs a rather complicated test setup together with precise test clock requirements. In this paper, we propose a test technique based on the digital oscillation test method. The technique, which was simulated in software, consists of sensitizing a critical path in the digital circuit under test and incorporating the path into an oscillation ring. The supply voltage to the oscillation ring is then varied to detect delay and stuck-at faults in the path.

AB - High-performance digital circuits with aggressive timing constraints are usually very susceptible to delay faults. Much research done on delay fault detection needs a rather complicated test setup together with precise test clock requirements. In this paper, we propose a test technique based on the digital oscillation test method. The technique, which was simulated in software, consists of sensitizing a critical path in the digital circuit under test and incorporating the path into an oscillation ring. The supply voltage to the oscillation ring is then varied to detect delay and stuck-at faults in the path.

KW - Delay fault testing

KW - Oscillation test method

KW - Low-voltage supply testing

M3 - Conference contribution

SN - 90-73461-33-2

SP - 520

EP - 525

BT - Proceeding Annual Workshop on Circuits, Systems and Signal Processing, ProRISC 2002

PB - STW

T2 - 13th Workshop on Circuits, Systems and Signal Processing, ProRISC 2002

Y2 - 28 November 2002 through 29 November 2002

ER -

The Application of a Square-Wave Supply Voltage to Detect Small Delay Faults in High-Speed Digital Circuits

Abstract

Workshop

Keywords

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