The Attributed Value of Semantic Features to Testlet Response Modeling

Bernard Veldkamp, Qiwei He, Muirne Paap

    Research output: Contribution to conferencePaper

    Original languageEnglish
    Publication statusPublished - 30 Apr 2013
    EventAnnual Meeting of the National Council on Measurement in Education (NCME) 2013 - InterContinental Hotel, San Francisco, United States
    Duration: 28 Apr 201330 Apr 2013

    Conference

    ConferenceAnnual Meeting of the National Council on Measurement in Education (NCME) 2013
    CountryUnited States
    CitySan Francisco
    Period28/04/1330/04/13

    Cite this

    Veldkamp, B., He, Q., & Paap, M. (2013). The Attributed Value of Semantic Features to Testlet Response Modeling. Paper presented at Annual Meeting of the National Council on Measurement in Education (NCME) 2013, San Francisco, United States.
    Veldkamp, Bernard ; He, Qiwei ; Paap, Muirne. / The Attributed Value of Semantic Features to Testlet Response Modeling. Paper presented at Annual Meeting of the National Council on Measurement in Education (NCME) 2013, San Francisco, United States.
    @conference{be6d17d578c441988eb691bf6f6c6dff,
    title = "The Attributed Value of Semantic Features to Testlet Response Modeling",
    author = "Bernard Veldkamp and Qiwei He and Muirne Paap",
    year = "2013",
    month = "4",
    day = "30",
    language = "English",
    note = "Annual Meeting of the National Council on Measurement in Education (NCME) 2013 ; Conference date: 28-04-2013 Through 30-04-2013",

    }

    Veldkamp, B, He, Q & Paap, M 2013, 'The Attributed Value of Semantic Features to Testlet Response Modeling' Paper presented at Annual Meeting of the National Council on Measurement in Education (NCME) 2013, San Francisco, United States, 28/04/13 - 30/04/13, .

    The Attributed Value of Semantic Features to Testlet Response Modeling. / Veldkamp, Bernard; He, Qiwei; Paap, Muirne.

    2013. Paper presented at Annual Meeting of the National Council on Measurement in Education (NCME) 2013, San Francisco, United States.

    Research output: Contribution to conferencePaper

    TY - CONF

    T1 - The Attributed Value of Semantic Features to Testlet Response Modeling

    AU - Veldkamp, Bernard

    AU - He, Qiwei

    AU - Paap, Muirne

    PY - 2013/4/30

    Y1 - 2013/4/30

    M3 - Paper

    ER -

    Veldkamp B, He Q, Paap M. The Attributed Value of Semantic Features to Testlet Response Modeling. 2013. Paper presented at Annual Meeting of the National Council on Measurement in Education (NCME) 2013, San Francisco, United States.