The CantiClever. A dedicated probe for magnetic force microscopy

A.G. van den Bos, I.R. Heskamp, Martin Herman Siekman, Leon Abelmann, J.C. Lodder

    Research output: Contribution to conferencePaper

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    Abstract

    With the current rate of increase in areal density of magnetic recording systems, todays resolution of MFM needs to be improved in order to remain useful as a measurement tool. The resolution of MFM is amongst others determined by the geometry of the magnetic tip, which for commercial probes consists of a thin magnetic coating deposited on a pyramidal Si AFM tip. Analysis of the imaging process shows that the shape of these tips is not ideal. For higher resolution, the tip must be shaped as an elongated bar with a flat front end. In this contribution we present a completely new MFM cantilever, the CantiClever, which is not derived from traditional AFM probes but optimized for MFM. Our design incorporates the cantilever and the magnetic tip in a single manufacturing process with the use of silicon micromachining techniques, allowing for batch fabrication of the probes. We realise the ideal tip shape by deposition of the magnetic material (Co) on the side of a free hanging silicon nitride layer.
    Original languageUndefined
    DOIs
    Publication statusPublished - 2002
    Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - RAI Congress Center, Amsterdam, Netherlands
    Duration: 28 Apr 20022 May 2002

    Conference

    Conference2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
    Abbreviated titleINTERMAG Europe 2002
    Country/TerritoryNetherlands
    CityAmsterdam
    Period28/04/022/05/02

    Keywords

    • IR-55896

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