The critical current in a NbTi tape measured in different directions of magnetic field and the current reduction due to the self field

B. ten Haken; L.J.M. van de Klundert; V.S. Vysotski; V.R. Karasik

doi:10.1109/20.119989

The critical current in a NbTi tape measured in different directions of magnetic field and the current reduction due to the self field

B. ten Haken, L.J.M. van de Klundert, V.S. Vysotski, V.R. Karasik

Faculty of Science and Technology

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

With reference to the application of NbTi tape in a superconducting thermal switch, the critical current of a 20-μm-thick NbTi tape was measured in several directions of the magnetic field. The critical current was found to behave strongly anisotropically, due to the deformation of the NbTi. The tape is extrasensitive to the component of the magnetic field perpendicular to the surface. Without an external field this component of the self-field reduces the critical current far below its intrinsic value. A one-dimensional model can describe the reduction of critical current due to the self-field in a thin tape

Original language	English
Pages (from-to)	755-758
Number of pages	4
Journal	IEEE transactions on magnetics
Volume	28
Issue number	1
DOIs	https://doi.org/10.1109/20.119989
Publication status	Published - 1992
Event	12th International Conference on Magnet Technology, MT-12 1991 - Leningrad (St. Petersburg), Russian Federation Duration: 24 Jun 1991 → 28 Jun 1991 Conference number: 12

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TenHaken1992criticalFinal published version, 354 KB

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title = "The critical current in a NbTi tape measured in different directions of magnetic field and the current reduction due to the self field",

abstract = "With reference to the application of NbTi tape in a superconducting thermal switch, the critical current of a 20-μm-thick NbTi tape was measured in several directions of the magnetic field. The critical current was found to behave strongly anisotropically, due to the deformation of the NbTi. The tape is extrasensitive to the component of the magnetic field perpendicular to the surface. Without an external field this component of the self-field reduces the critical current far below its intrinsic value. A one-dimensional model can describe the reduction of critical current due to the self-field in a thin tape",

author = "{ten Haken}, B. and {van de Klundert}, L.J.M. and V.S. Vysotski and V.R. Karasik",

year = "1992",

doi = "10.1109/20.119989",

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volume = "28",

pages = "755--758",

journal = "IEEE transactions on magnetics",

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note = "12th International Conference on Magnet Technology, MT-12 1991, MT ; Conference date: 24-06-1991 Through 28-06-1991",

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TY - JOUR

T1 - The critical current in a NbTi tape measured in different directions of magnetic field and the current reduction due to the self field

AU - ten Haken, B.

AU - van de Klundert, L.J.M.

AU - Vysotski, V.S.

AU - Karasik, V.R.

N1 - Conference code: 12

PY - 1992

Y1 - 1992

N2 - With reference to the application of NbTi tape in a superconducting thermal switch, the critical current of a 20-μm-thick NbTi tape was measured in several directions of the magnetic field. The critical current was found to behave strongly anisotropically, due to the deformation of the NbTi. The tape is extrasensitive to the component of the magnetic field perpendicular to the surface. Without an external field this component of the self-field reduces the critical current far below its intrinsic value. A one-dimensional model can describe the reduction of critical current due to the self-field in a thin tape

AB - With reference to the application of NbTi tape in a superconducting thermal switch, the critical current of a 20-μm-thick NbTi tape was measured in several directions of the magnetic field. The critical current was found to behave strongly anisotropically, due to the deformation of the NbTi. The tape is extrasensitive to the component of the magnetic field perpendicular to the surface. Without an external field this component of the self-field reduces the critical current far below its intrinsic value. A one-dimensional model can describe the reduction of critical current due to the self-field in a thin tape

U2 - 10.1109/20.119989

DO - 10.1109/20.119989

M3 - Article

SN - 0018-9464

VL - 28

SP - 755

EP - 758

JO - IEEE transactions on magnetics

JF - IEEE transactions on magnetics

IS - 1

T2 - 12th International Conference on Magnet Technology, MT-12 1991

Y2 - 24 June 1991 through 28 June 1991

ER -

The critical current in a NbTi tape measured in different directions of magnetic field and the current reduction due to the self field

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