The crystal growth and characterization of CeT2Si2 ternary intermetallics (T = Ni, Pd, Pt)

A. A. Menovsky*, C. E. Snel, T. J. Gortenmulder, H. J. Tan, T. T.M. Palstra

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

Bulk single crystals of the ternary intermetallic compounds CeNi2Si2, CePd2Si2 and CePt2Si2 have been grown from the melt with a modified "tri-arc" Czochralski method. The as-grown crystals were characterized by X-ray, microprobe, and chemical analyses. The measured densities were compared with the calculated densities as obtained from the lattice parameters. In all as-grown single crystals no detectable precipitates of foreign phases were observed. These precipitates are always present in polycrystalline samples, even after a heat-treatment, and are visible on the grain boundaries and in the subgrain structure.

Original languageEnglish
Pages (from-to)231-235
Number of pages5
JournalJournal of crystal growth
Volume74
Issue number2
DOIs
Publication statusPublished - 1 Jan 1986
Externally publishedYes

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