The crystal growth and characterization of CeT2Si2 ternary intermetallics (T = Ni, Pd, Pt)

A. A. Menovsky; C. E. Snel; T. J. Gortenmulder; H. J. Tan; T. T.M. Palstra

doi:10.1016/0022-0248(86)90112-0

The crystal growth and characterization of CeT₂Si₂ ternary intermetallics (T = Ni, Pd, Pt)

A. A. Menovsky^*, C. E. Snel, T. J. Gortenmulder, H. J. Tan, T. T.M. Palstra

^*Corresponding author for this work

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Abstract

Bulk single crystals of the ternary intermetallic compounds CeNi₂Si₂, CePd₂Si₂ and CePt₂Si₂ have been grown from the melt with a modified "tri-arc" Czochralski method. The as-grown crystals were characterized by X-ray, microprobe, and chemical analyses. The measured densities were compared with the calculated densities as obtained from the lattice parameters. In all as-grown single crystals no detectable precipitates of foreign phases were observed. These precipitates are always present in polycrystalline samples, even after a heat-treatment, and are visible on the grain boundaries and in the subgrain structure.

Original language	English
Pages (from-to)	231-235
Number of pages	5
Journal	Journal of crystal growth
Volume	74
Issue number	2
DOIs	https://doi.org/10.1016/0022-0248(86)90112-0
Publication status	Published - 1 Jan 1986
Externally published	Yes

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T1 - The crystal growth and characterization of CeT2Si2 ternary intermetallics (T = Ni, Pd, Pt)

AU - Menovsky, A. A.

AU - Snel, C. E.

AU - Gortenmulder, T. J.

AU - Tan, H. J.

AU - Palstra, T. T.M.

PY - 1986/1/1

Y1 - 1986/1/1

N2 - Bulk single crystals of the ternary intermetallic compounds CeNi2Si2, CePd2Si2 and CePt2Si2 have been grown from the melt with a modified "tri-arc" Czochralski method. The as-grown crystals were characterized by X-ray, microprobe, and chemical analyses. The measured densities were compared with the calculated densities as obtained from the lattice parameters. In all as-grown single crystals no detectable precipitates of foreign phases were observed. These precipitates are always present in polycrystalline samples, even after a heat-treatment, and are visible on the grain boundaries and in the subgrain structure.

AB - Bulk single crystals of the ternary intermetallic compounds CeNi2Si2, CePd2Si2 and CePt2Si2 have been grown from the melt with a modified "tri-arc" Czochralski method. The as-grown crystals were characterized by X-ray, microprobe, and chemical analyses. The measured densities were compared with the calculated densities as obtained from the lattice parameters. In all as-grown single crystals no detectable precipitates of foreign phases were observed. These precipitates are always present in polycrystalline samples, even after a heat-treatment, and are visible on the grain boundaries and in the subgrain structure.

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The crystal growth and characterization of CeT₂Si₂ ternary intermetallics (T = Ni, Pd, Pt)

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