The Detection of Defects in a Niobium Tri-layer Process

A. Joseph Arun, Sander Heuvelmans, Gerrit J. Gerritsma, Hans G. Kerkhoff

    Research output: Contribution to journalConference articleAcademicpeer-review

    5 Citations (Scopus)
    54 Downloads (Pure)

    Fingerprint Dive into the research topics of 'The Detection of Defects in a Niobium Tri-layer Process'. Together they form a unique fingerprint.

    Physics & Astronomy

    Chemistry and Materials

    General

    Physics

    Chemical Compounds

    Engineering & Materials Science