The effect of external magnetic field on mark size during field emission assisted magnetic probe recording on CoNi/Pt multilayers

Li Zhang*, James A. Bain, Jian-Gang Zhu, Leon Abelmann, Takahiro Onoue

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    Abstract

    In this work, we characterize a heat-assisted magnetic recording process potentially suitable for proposed probe-based storage systems. A scanning tunneling microscope (STM) is used to locally heat a uniformly magnetized perpendicular recording medium via field emission current. The recording medium is a 30 nm thick CoNi/Pt multilayer film (H/sub C/ = 100 kA/m [1.2 kOe], M/sub S/ = 360 kA/m) with a 23 nm thick Pt seedlayer, fabricated on a bare Si substrate. Voltage pulses were applied between STM tip (made of Ir/Pt) and the medium to write marks with external magnetic field applied. A magnetic force microscope (MFM) is used to image marks. Mark size was measured as the FWHM of MFM phase signal. Experimental results show that mark size increases with increasing positive field and decreases with increasing negative field. A model is quantitatively simulate our experimental results and we are able to predict tip and medium configurations and applied powers that should permit marks appropriate for recording at 1 Tbit/in/sup 2/ and beyond.
    Original languageEnglish
    Title of host publicationINTERMAG ASIA 2005
    Subtitle of host publicationDigests of the IEEE International Magnetics Conference
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Pages123-123
    Number of pages1
    ISBN (Print)0-7803-9009-1
    DOIs
    Publication statusPublished - 12 Dec 2005
    Event2005 IEEE International Magnetics Conference, INTERMAG ASIA 2005 - Nagoya, Japan, Nagoya, Japan
    Duration: 4 Apr 20058 Apr 2005

    Publication series

    NameIEEE International Magnetics Conference (INTERMAG)
    PublisherIEEE
    Volume2005
    ISSN (Print)2150-4598
    ISSN (Electronic)2150-4601

    Conference

    Conference2005 IEEE International Magnetics Conference, INTERMAG ASIA 2005
    Abbreviated titleINTERMAG ASIA 2005
    Country/TerritoryJapan
    CityNagoya
    Period4/04/058/04/05
    Other4-8 April 2005

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