Abstract
Thin alumina films, deposited at 280°C by low-pressure, metal-organic, chemical-vapor deposition on stainless steel, type AISI 304, were annealed at 0.17 kPa in a nitrogen atmosphere for 2,4, and 17 hr at 600, 700, and 800°C. The effect of the annealing process on the adhesion of the thin alumina films was studied using a scanning-scratch tester, type SST-101, developed by Shimadzu. The best mechanical properties were obtained with unannealed samples. After thermal annealing the critical load decreased, proportional to annealing time and/or temperature. This effect was probably due to the presence of a high thermal stress and to preferential segregation of sulfur near the oxidealloy interface.
Original language | English |
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Pages (from-to) | 459-478 |
Number of pages | 20 |
Journal | Oxidation of metals |
Volume | 43 |
Issue number | 5/6 |
DOIs | |
Publication status | Published - 1995 |
Keywords
- Scanning-scratch test (SST)
- Chemical-vapor deposition (MOCVD)
- Thermal annealing
- Alumina films
- Metal-organic
- Adherence