The dependence of the submicron domain period of CoCr films in ascending and descending fields (dc: 8-320 kA/m; superposed ac: 0-55 kA/m) normal to the surface was investigated using the colloid-SEM method. Low coercivity samples (Hc/Hk ~ 0.02) were measured. Comparison with calculations furnished fair agreement in contradistinction to samples having H c/Hk ~ 0.05. The exchange constant A was deteremined from the thickness dependence of the domain period.
|Number of pages||1|
|Journal||Journal de Physique. Colloque|
|Publication status||Published - 1988|
- SMI-MAT: MATERIALS
- SMI-TST: From 2006 in EWI-TST