The field dependence of the domain period in CoCr films

J. Kaczer; J. Simsova; R. Gemperle; L. Murtinova; J.C. Lodder

The field dependence of the domain period in CoCr films

J. Kaczer, J. Simsova, R. Gemperle, L. Murtinova, J.C. Lodder

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Abstract

The dependence of the submicron domain period of CoCr films in ascending and descending fields (dc: 8-320 kA/m; superposed ac: 0-55 kA/m) normal to the surface was investigated using the colloid-SEM method. Low coercivity samples (Hc/Hk ~ 0.02) were measured. Comparison with calculations furnished fair agreement in contradistinction to samples having H c/Hk ~ 0.05. The exchange constant A was deteremined from the thickness dependence of the domain period.

Original language	Undefined
Pages (from-to)	49-49
Number of pages	1
Journal	Journal de Physique. Colloque
Volume	c8
Publication status	Published - 1988

Keywords

EWI-5470
SMI-MAT: MATERIALS
SMI-TST: From 2006 in EWI-TST
IR-66103

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Cite this

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title = "The field dependence of the domain period in CoCr films",

abstract = "The dependence of the submicron domain period of CoCr films in ascending and descending fields (dc: 8-320 kA/m; superposed ac: 0-55 kA/m) normal to the surface was investigated using the colloid-SEM method. Low coercivity samples (Hc/Hk \textasciitilde{} 0.02) were measured. Comparison with calculations furnished fair agreement in contradistinction to samples having H c/Hk \textasciitilde{} 0.05. The exchange constant A was deteremined from the thickness dependence of the domain period.",

keywords = "EWI-5470, SMI-MAT: MATERIALS, SMI-TST: From 2006 in EWI-TST, IR-66103",

author = "J. Kaczer and J. Simsova and R. Gemperle and L. Murtinova and J.C. Lodder",

note = "Imported from SMI Reference manager",

year = "1988",

language = "Undefined",

volume = "c8",

pages = "49--49",

journal = "Journal de Physique. Colloque",

issn = "0449-1947",

publisher = "Springer",

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TY - JOUR

T1 - The field dependence of the domain period in CoCr films

AU - Kaczer, J.

AU - Simsova, J.

AU - Gemperle, R.

AU - Murtinova, L.

AU - Lodder, J.C.

N1 - Imported from SMI Reference manager

PY - 1988

Y1 - 1988

N2 - The dependence of the submicron domain period of CoCr films in ascending and descending fields (dc: 8-320 kA/m; superposed ac: 0-55 kA/m) normal to the surface was investigated using the colloid-SEM method. Low coercivity samples (Hc/Hk ~ 0.02) were measured. Comparison with calculations furnished fair agreement in contradistinction to samples having H c/Hk ~ 0.05. The exchange constant A was deteremined from the thickness dependence of the domain period.

AB - The dependence of the submicron domain period of CoCr films in ascending and descending fields (dc: 8-320 kA/m; superposed ac: 0-55 kA/m) normal to the surface was investigated using the colloid-SEM method. Low coercivity samples (Hc/Hk ~ 0.02) were measured. Comparison with calculations furnished fair agreement in contradistinction to samples having H c/Hk ~ 0.05. The exchange constant A was deteremined from the thickness dependence of the domain period.

KW - EWI-5470

KW - SMI-MAT: MATERIALS

KW - SMI-TST: From 2006 in EWI-TST

KW - IR-66103

M3 - Article

SN - 0449-1947

VL - c8

SP - 49

EP - 49

JO - Journal de Physique. Colloque

JF - Journal de Physique. Colloque

ER -