The impact of CMOS scaling projected on a 6b full-Nyquist non-calibrated flash ADC

P. Veldhorst, George Guksun, Anne J. Annema, Bram Nauta, Berry Buter, Maarten Vertregt

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

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    Abstract

    A 6-bit 1.2 Gs/s non-calibrated flash ADC in a standard 45nm CMOS process, that achieves 0.45pJ/conv-step at full Nyquist bandwidth, is presented. Power efficient operation is achieved by a full optimization of amplifier blocks, and by innovations in the comparator and encoding stage. The performance of a non-calibrated flash ADC is directly related to device properties; a scaling analysis of our ADC in and across CMOS technologies gives insight into the excellent usability of 45nm technology for AD converter design.
    Original languageUndefined
    Title of host publicationProrisc 2009. 20th Annual Workshop on circuits, Systems and Signal Processing
    Place of PublicationUtrecht
    PublisherSTW
    Pages380-383
    Number of pages4
    ISBN (Print)978-90-73461-62-8
    Publication statusPublished - 26 Nov 2009
    Event20th Annual Workshop on circuits, Systems and Signal Processing, Prorisc 2009 - Veldhoven, Netherlands
    Duration: 26 Nov 200927 Nov 2009
    Conference number: 20

    Publication series

    Name
    PublisherSTW

    Conference

    Conference20th Annual Workshop on circuits, Systems and Signal Processing, Prorisc 2009
    CountryNetherlands
    CityVeldhoven
    Period26/11/0927/11/09

    Keywords

    • METIS-265789
    • EWI-17425
    • IR-70027

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