The impact of CMOS scaling projected on a 6b full-Nyquist non-calibrated flash ADC

P. Veldhorst; George Guksun; Anne J. Annema; Bram Nauta; Berry Buter; Maarten Vertregt

The impact of CMOS scaling projected on a 6b full-Nyquist non-calibrated flash ADC

P. Veldhorst, George Guksun, Anne J. Annema, Bram Nauta, Berry Buter, Maarten Vertregt

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

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Abstract

A 6-bit 1.2 Gs/s non-calibrated flash ADC in a standard 45nm CMOS process, that achieves 0.45pJ/conv-step at full Nyquist bandwidth, is presented. Power efficient operation is achieved by a full optimization of amplifier blocks, and by innovations in the comparator and encoding stage. The performance of a non-calibrated flash ADC is directly related to device properties; a scaling analysis of our ADC in and across CMOS technologies gives insight into the excellent usability of 45nm technology for AD converter design.

Original language	Undefined
Title of host publication	Prorisc 2009. 20th Annual Workshop on circuits, Systems and Signal Processing
Place of Publication	Utrecht
Publisher	STW
Pages	380-383
Number of pages	4
ISBN (Print)	978-90-73461-62-8
Publication status	Published - 26 Nov 2009
Event	20th Annual Workshop on circuits, Systems and Signal Processing, Prorisc 2009 - Veldhoven, Netherlands Duration: 26 Nov 2009 → 27 Nov 2009 Conference number: 20

Publication series

Name
Publisher	STW

Conference

Conference	20th Annual Workshop on circuits, Systems and Signal Processing, Prorisc 2009
Country/Territory	Netherlands
City	Veldhoven
Period	26/11/09 → 27/11/09

Keywords

METIS-265789
EWI-17425
IR-70027

Access to Document

veldhorst_Prorisc_2009._The_impact_of_CMOS_scaling_projected_on_a_6b_full-Nyquist_non-calibrated_flash_ADC

http://eprints.eemcs.utwente.nl/secure2/17425/01/veldhorst_Prorisc_2009._The_impact_of_CMOS_scaling_projected_on_a_6b_full-Nyquist_non-calibrated_flash_ADC.pdf

Cite this

Veldhorst, P., Guksun, G., Annema, A. J., Nauta, B., Buter, B., & Vertregt, M. (2009). The impact of CMOS scaling projected on a 6b full-Nyquist non-calibrated flash ADC. In Prorisc 2009. 20th Annual Workshop on circuits, Systems and Signal Processing (pp. 380-383). STW. http://eprints.eemcs.utwente.nl/secure2/17425/01/veldhorst_Prorisc_2009._The_impact_of_CMOS_scaling_projected_on_a_6b_full-Nyquist_non-calibrated_flash_ADC.pdf

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abstract = "A 6-bit 1.2 Gs/s non-calibrated flash ADC in a standard 45nm CMOS process, that achieves 0.45pJ/conv-step at full Nyquist bandwidth, is presented. Power efficient operation is achieved by a full optimization of amplifier blocks, and by innovations in the comparator and encoding stage. The performance of a non-calibrated flash ADC is directly related to device properties; a scaling analysis of our ADC in and across CMOS technologies gives insight into the excellent usability of 45nm technology for AD converter design.",

keywords = "METIS-265789, EWI-17425, IR-70027",

author = "P. Veldhorst and George Guksun and Annema, {Anne J.} and Bram Nauta and Berry Buter and Maarten Vertregt",

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Veldhorst, P, Guksun, G, Annema, AJ , Nauta, B, Buter, B & Vertregt, M 2009, The impact of CMOS scaling projected on a 6b full-Nyquist non-calibrated flash ADC. in Prorisc 2009. 20th Annual Workshop on circuits, Systems and Signal Processing. STW, Utrecht, pp. 380-383, 20th Annual Workshop on circuits, Systems and Signal Processing, Prorisc 2009, Veldhoven, Netherlands, 26/11/09. <http://eprints.eemcs.utwente.nl/secure2/17425/01/veldhorst_Prorisc_2009._The_impact_of_CMOS_scaling_projected_on_a_6b_full-Nyquist_non-calibrated_flash_ADC.pdf>

The impact of CMOS scaling projected on a 6b full-Nyquist non-calibrated flash ADC. / Veldhorst, P.; Guksun, George; Annema, Anne J.; Nauta, Bram; Buter, Berry; Vertregt, Maarten.

Prorisc 2009. 20th Annual Workshop on circuits, Systems and Signal Processing. Utrecht : STW, 2009. p. 380-383.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - The impact of CMOS scaling projected on a 6b full-Nyquist non-calibrated flash ADC

AU - Veldhorst, P.

AU - Guksun, George

AU - Annema, Anne J.

AU - Nauta, Bram

AU - Buter, Berry

AU - Vertregt, Maarten

N1 - Conference code: 20

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N2 - A 6-bit 1.2 Gs/s non-calibrated flash ADC in a standard 45nm CMOS process, that achieves 0.45pJ/conv-step at full Nyquist bandwidth, is presented. Power efficient operation is achieved by a full optimization of amplifier blocks, and by innovations in the comparator and encoding stage. The performance of a non-calibrated flash ADC is directly related to device properties; a scaling analysis of our ADC in and across CMOS technologies gives insight into the excellent usability of 45nm technology for AD converter design.

AB - A 6-bit 1.2 Gs/s non-calibrated flash ADC in a standard 45nm CMOS process, that achieves 0.45pJ/conv-step at full Nyquist bandwidth, is presented. Power efficient operation is achieved by a full optimization of amplifier blocks, and by innovations in the comparator and encoding stage. The performance of a non-calibrated flash ADC is directly related to device properties; a scaling analysis of our ADC in and across CMOS technologies gives insight into the excellent usability of 45nm technology for AD converter design.

KW - METIS-265789

KW - EWI-17425

KW - IR-70027

M3 - Conference contribution

SN - 978-90-73461-62-8

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EP - 383

BT - Prorisc 2009. 20th Annual Workshop on circuits, Systems and Signal Processing

PB - STW

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Y2 - 26 November 2009 through 27 November 2009

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