Abstract
The performance of a face recognition system depends on the quality of both test and reference images participating in the face comparison process. In a forensic evaluation case involving face recognition, we do not have any control over the quality of the trace (image captured by a CCTV at a crime scene) and it is usually of very low quality. However, forensic investigators have some control over the quality of suspects reference images. In this paper, we investigate if it is useful to modify the quality of the reference (usually, good quality mug shot) images in order to achieve better recognition performance using a view based face recognition system. We found that approximately matching non-frontal pose between test and reference images can greatly improve recognition performance. Moreover, it is the relative difference in pose between the test and reference image that determines the extent of influence that other quality parameters like illumination, noise, motion blur, and resolution have on the face recognition performance.
Original language | English |
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Title of host publication | 33rd Symposium on Information Theory in the Benelux and the 2nd Joint WIC/IEEE Symposium on Information Theory and Signal Processing in the Benelux |
Place of Publication | Enschede, the Netherlands |
Publisher | Werkgemeenschap voor Informatie- en Communicatietheorie (WIC) |
Pages | 141-148 |
Number of pages | 8 |
ISBN (Print) | 978-90-365-3383-6 |
Publication status | Published - May 2012 |
Event | 33rd WIC Symposium on Information Theory in the Benelux and the 2nd Joint WIC/IEEE Symposium on Information Theory and Signal Processing in the Benelux 2012 - Boekelo, Netherlands Duration: 24 May 2012 → 25 May 2012 Conference number: 33 |
Conference
Conference | 33rd WIC Symposium on Information Theory in the Benelux and the 2nd Joint WIC/IEEE Symposium on Information Theory and Signal Processing in the Benelux 2012 |
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Country/Territory | Netherlands |
City | Boekelo |
Period | 24/05/12 → 25/05/12 |
Keywords
- METIS-286374
- IR-80521
- Face Recognition
- SCS-Safety
- EWI-21891
- Performance Evaluation
- Image quality