The Influence of a Crack on Digital Superconductor Logic

A.J. Arun, Marcel H.H. Weusthof, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of IEEE European Test Symposuma Corsica
Place of Publication	Corsica, France
Publisher	IEEE
Pages	183-184
Number of pages	2
Publication status	Published - 24 May 2004
Event	9th IEEE European Test Symposuma Corsica 2004: Proceedings of IEEE European Test Symposuma Corsica - Corsica, France Duration: 24 May 2004 → 26 May 2004

Conference	9th IEEE European Test Symposuma Corsica 2004
City	Corsica, France
Period	24/05/04 → 26/05/04

Keywords

@inproceedings{7cbb93ced9934456ba55039a268aa443,

title = "The Influence of a Crack on Digital Superconductor Logic",

keywords = "METIS-218935",

author = "A.J. Arun and Weusthof, {Marcel H.H.} and Kerkhoff, {Hans G.}",

year = "2004",

month = may,

day = "24",

language = "Undefined",

pages = "183--184",

booktitle = "Proceedings of IEEE European Test Symposuma Corsica",

publisher = "IEEE",

address = "United States",

note = "9th IEEE European Test Symposuma Corsica 2004 ; Conference date: 24-05-2004 Through 26-05-2004",

}

TY - GEN

T1 - The Influence of a Crack on Digital Superconductor Logic

AU - Arun, A.J.

AU - Weusthof, Marcel H.H.

AU - Kerkhoff, Hans G.

PY - 2004/5/24

Y1 - 2004/5/24

KW - METIS-218935

M3 - Conference contribution

SP - 183

EP - 184

BT - Proceedings of IEEE European Test Symposuma Corsica

PB - IEEE

CY - Corsica, France

T2 - 9th IEEE European Test Symposuma Corsica 2004

Y2 - 24 May 2004 through 26 May 2004

ER -