The Influence of a Crack on Digital Superconductor Logic

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    Original languageUndefined
    Title of host publicationProceedings of IEEE European Test Symposuma Corsica
    Place of PublicationCorsica, France
    PublisherIEEE
    Pages183-184
    Number of pages2
    Publication statusPublished - 24 May 2004

    Keywords

    • METIS-218935

    Cite this

    Arun, A. J., Weusthof, M. H. H., & Kerkhoff, H. G. (2004). The Influence of a Crack on Digital Superconductor Logic. In Proceedings of IEEE European Test Symposuma Corsica (pp. 183-184). Corsica, France: IEEE.