The Influence of a Crack on Digital Superconductor Logic

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of IEEE European Test Symposuma Corsica
    Place of PublicationCorsica, France
    PublisherIEEE
    Pages183-184
    Number of pages2
    Publication statusPublished - 24 May 2004

    Keywords

    • METIS-218935

    Cite this

    Arun, A. J., Weusthof, M. H. H., & Kerkhoff, H. G. (2004). The Influence of a Crack on Digital Superconductor Logic. In Proceedings of IEEE European Test Symposuma Corsica (pp. 183-184). Corsica, France: IEEE.
    Arun, A.J. ; Weusthof, Marcel H.H. ; Kerkhoff, Hans G. / The Influence of a Crack on Digital Superconductor Logic. Proceedings of IEEE European Test Symposuma Corsica. Corsica, France : IEEE, 2004. pp. 183-184
    @inproceedings{7cbb93ced9934456ba55039a268aa443,
    title = "The Influence of a Crack on Digital Superconductor Logic",
    keywords = "METIS-218935",
    author = "A.J. Arun and Weusthof, {Marcel H.H.} and Kerkhoff, {Hans G.}",
    year = "2004",
    month = "5",
    day = "24",
    language = "Undefined",
    pages = "183--184",
    booktitle = "Proceedings of IEEE European Test Symposuma Corsica",
    publisher = "IEEE",
    address = "United States",

    }

    Arun, AJ, Weusthof, MHH & Kerkhoff, HG 2004, The Influence of a Crack on Digital Superconductor Logic. in Proceedings of IEEE European Test Symposuma Corsica. IEEE, Corsica, France, pp. 183-184.

    The Influence of a Crack on Digital Superconductor Logic. / Arun, A.J.; Weusthof, Marcel H.H.; Kerkhoff, Hans G.

    Proceedings of IEEE European Test Symposuma Corsica. Corsica, France : IEEE, 2004. p. 183-184.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - The Influence of a Crack on Digital Superconductor Logic

    AU - Arun, A.J.

    AU - Weusthof, Marcel H.H.

    AU - Kerkhoff, Hans G.

    PY - 2004/5/24

    Y1 - 2004/5/24

    KW - METIS-218935

    M3 - Conference contribution

    SP - 183

    EP - 184

    BT - Proceedings of IEEE European Test Symposuma Corsica

    PB - IEEE

    CY - Corsica, France

    ER -

    Arun AJ, Weusthof MHH, Kerkhoff HG. The Influence of a Crack on Digital Superconductor Logic. In Proceedings of IEEE European Test Symposuma Corsica. Corsica, France: IEEE. 2004. p. 183-184