Abstract
A graphical method has been developed to determine the plane of incidence in the presence of cell windows with small retardation. For two types of rotating-analyzer ellipsometers, expressions have been derived that relate the experimental parameters and the elements of the Mueller imperfection matrices of the windows. These matrices can be determined by measuring with and without cell windows. Measurements have been performed with three samples with different optical constants.
| Original language | Undefined |
|---|---|
| Pages (from-to) | 217-231 |
| Journal | Surface science |
| Volume | 96 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 1980 |
Keywords
- IR-68491