The influence of geologic sample surfaces on TIR spectroscopy : powerpoint

E. Rost, C.A. Hecker, F.D. van der Meer, M.C. Schodlok

Research output: Contribution to conferenceOtherOther research output

Original languageEnglish
Pages1-14
Publication statusPublished - 19 Apr 2017
Event10th EARSeL SIG Imaging Spectroscopy Workshop - University of Zurich, Zurich, Switzerland
Duration: 19 Apr 201721 Apr 2017
http://www.earsel.org/SIG/IS/workshops/10-IS-Workshop/

Conference

Conference10th EARSeL SIG Imaging Spectroscopy Workshop
Country/TerritorySwitzerland
CityZurich
Period19/04/1721/04/17
Internet address

Keywords

  • Infrared spectroscopy
  • Infrared spectra
  • Scanning Electron Microscopy (SEM)
  • Surface Roughness
  • Minerals
  • Thermal infrared

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