The influence of no fault found in analogue CMOS circuits

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    Abstract

    The most difficult fault category in electronic systems is the “No Fault Found‿ (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined.
    Original languageUndefined
    Title of host publication2014 International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14)
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages1-6
    Number of pages6
    ISBN (Print)978-1-47996-540-3
    DOIs
    Publication statusPublished - 19 Sep 2014
    Event19th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2014 - Porto Alegre, Brazil
    Duration: 17 Sep 201419 Sep 2014
    Conference number: 19

    Publication series

    Name
    PublisherIEEE Computer Society

    Workshop

    Workshop19th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2014
    Abbreviated titleIMS3TW
    CountryBrazil
    CityPorto Alegre
    Period17/09/1419/09/14

    Keywords

    • CAES-TDT: Testable Design and Test
    • TSV
    • cold soldering
    • EWI-25306
    • METIS-309662
    • NFF
    • analogue CMOS circuits
    • No Fault Found
    • IR-93271
    • Intermittent Resistive Faults

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