The influence of no fault found in analogue CMOS circuits

J. Wan; Hans G. Kerkhoff

doi:10.1109/IMS3TW.2014.6997388

The influence of no fault found in analogue CMOS circuits

J. Wan, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

11 Citations (Scopus)

63 Downloads (Pure)

Abstract

The most difficult fault category in electronic systems is the “No Fault Found‿ (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined.

Original language	Undefined
Title of host publication	2014 International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14)
Place of Publication	USA
Publisher	IEEE
Pages	1-6
Number of pages	6
ISBN (Print)	978-1-47996-540-3
DOIs	https://doi.org/10.1109/IMS3TW.2014.6997388
Publication status	Published - 19 Sept 2014
Event	19th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2014 - Porto Alegre, Brazil Duration: 17 Sept 2014 → 19 Sept 2014 Conference number: 19

Publication series

Name
Publisher	IEEE Computer Society

Workshop

Workshop	19th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2014
Abbreviated title	IMS3TW
Country/Territory	Brazil
City	Porto Alegre
Period	17/09/14 → 19/09/14

Keywords

CAES-TDT: Testable Design and Test
TSV
cold soldering
EWI-25306
METIS-309662
NFF
analogue CMOS circuits
No Fault Found
IR-93271
Intermittent Resistive Faults

Access to Document

10.1109/IMS3TW.2014.6997388

sessions_127503

Cite this

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title = "The influence of no fault found in analogue CMOS circuits",

abstract = "The most difficult fault category in electronic systems is the “No Fault Found‿ (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined.",

keywords = "CAES-TDT: Testable Design and Test, TSV, cold soldering, EWI-25306, METIS-309662, NFF, analogue CMOS circuits, No Fault Found, IR-93271, Intermittent Resistive Faults",

author = "J. Wan and Kerkhoff, {Hans G.}",

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AU - Kerkhoff, Hans G.

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N2 - The most difficult fault category in electronic systems is the “No Fault Found‿ (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined.

AB - The most difficult fault category in electronic systems is the “No Fault Found‿ (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined.

KW - CAES-TDT: Testable Design and Test

KW - TSV

KW - cold soldering

KW - EWI-25306

KW - METIS-309662

KW - NFF

KW - analogue CMOS circuits

KW - No Fault Found

KW - IR-93271

KW - Intermittent Resistive Faults

U2 - 10.1109/IMS3TW.2014.6997388

DO - 10.1109/IMS3TW.2014.6997388

M3 - Conference contribution

SN - 978-1-47996-540-3

SP - 1

EP - 6

BT - 2014 International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14)

PB - IEEE

CY - USA

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