The influence of sample geometry on the magnetoresistance of Ni- Fe films

J.H.J. Fluitman

doi:10.1016/0040-6090(73)90080-1

The influence of sample geometry on the magnetoresistance of Ni- Fe films

J.H.J. Fluitman

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Abstract

The magnetoresistance of Ni-Fe (81–91) films has been measured as a function of film geometry (thickness to width ratio N). It has been found that under the condition of large magnetization dispersion the behaviour of films with a high value of N differs distinctly from that of films with N ≈ 0. Moreover, the easy axis coercive force Hc increases markedly when the width of the film is of the order of 20 μm and less.

Original language	English
Pages (from-to)	269-276
Number of pages	8
Journal	Thin solid films
Volume	16
Issue number	3
DOIs	https://doi.org/10.1016/0040-6090(73)90080-1
Publication status	Published - 1973

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SMI-TST: From 2006 in EWI-TST
SMI-REC: RECORDING

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title = "The influence of sample geometry on the magnetoresistance of Ni- Fe films",

abstract = "The magnetoresistance of Ni-Fe (81–91) films has been measured as a function of film geometry (thickness to width ratio N). It has been found that under the condition of large magnetization dispersion the behaviour of films with a high value of N differs distinctly from that of films with N ≈ 0. Moreover, the easy axis coercive force Hc increases markedly when the width of the film is of the order of 20 μm and less.",

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AB - The magnetoresistance of Ni-Fe (81–91) films has been measured as a function of film geometry (thickness to width ratio N). It has been found that under the condition of large magnetization dispersion the behaviour of films with a high value of N differs distinctly from that of films with N ≈ 0. Moreover, the easy axis coercive force Hc increases markedly when the width of the film is of the order of 20 μm and less.

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-REC: RECORDING

U2 - 10.1016/0040-6090(73)90080-1

DO - 10.1016/0040-6090(73)90080-1

M3 - Article

SN - 0040-6090

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SP - 269

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JO - Thin solid films

JF - Thin solid films

IS - 3

ER -

The influence of sample geometry on the magnetoresistance of Ni- Fe films

Abstract

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