The influence of scattering processes in quantitative X-ray fluorescence analysis

M. Bos; J.A.M. Vrielink

doi:10.1016/j.aca.2005.04.009

The influence of scattering processes in quantitative X-ray fluorescence analysis

M. Bos, J.A.M. Vrielink

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Abstract

Existing theory was used to develop a fundamental parameter (FP) computer program for quantitative X-ray fluorescence (XRF) spectrometry in which scattering interactions are taken into account. The program is suited for polychromatic radiation and composite samples and is used to estimate the errors that result from neglecting the scattering contributions in the analysis of samples in a low Z matrix when the spectrometer is calibrated either on pure elements or on standards similar to the samples.

Original language	English
Pages (from-to)	92-98
Number of pages	7
Journal	Analytica chimica acta
Volume	545
Issue number	1
DOIs	https://doi.org/10.1016/j.aca.2005.04.009
Publication status	Published - 2005

Keywords

Quantitative XRF Rayleigh Compton scattering
n/a OA procedure

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10.1016/j.aca.2005.04.009

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title = "The influence of scattering processes in quantitative X-ray fluorescence analysis",

abstract = "Existing theory was used to develop a fundamental parameter (FP) computer program for quantitative X-ray fluorescence (XRF) spectrometry in which scattering interactions are taken into account. The program is suited for polychromatic radiation and composite samples and is used to estimate the errors that result from neglecting the scattering contributions in the analysis of samples in a low Z matrix when the spectrometer is calibrated either on pure elements or on standards similar to the samples.",

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AU - Vrielink, J.A.M.

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AB - Existing theory was used to develop a fundamental parameter (FP) computer program for quantitative X-ray fluorescence (XRF) spectrometry in which scattering interactions are taken into account. The program is suited for polychromatic radiation and composite samples and is used to estimate the errors that result from neglecting the scattering contributions in the analysis of samples in a low Z matrix when the spectrometer is calibrated either on pure elements or on standards similar to the samples.

KW - Quantitative XRF Rayleigh Compton scattering

KW - n/a OA procedure

U2 - 10.1016/j.aca.2005.04.009

DO - 10.1016/j.aca.2005.04.009

M3 - Article

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VL - 545

SP - 92

EP - 98

JO - Analytica chimica acta

JF - Analytica chimica acta

IS - 1

ER -

The influence of scattering processes in quantitative X-ray fluorescence analysis

Abstract

Keywords

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