Abstract
In this study, we investigated the influence of Ta content (in Co86Cr12Ta2 and Co82Cr13Ta5 compositions) on magnetic and structural properties of Co–Cr–Ta perpendicular media samples grown on Si substrates at different substrate temperatures during RF-sputter deposition. In general, coercivity of Co82Cr13Ta5 samples is higher than that of Co86Cr12Ta2 samples, whereas the perpendicular c-axis orientation of Co86Cr12Ta2 samples is better. Ta content was suggested to be in between 2 and 5 at% to give optimum magnetic and structural properties.
Original language | English |
---|---|
Pages (from-to) | 117-120 |
Number of pages | 4 |
Journal | Journal of magnetism and magnetic materials |
Volume | 193 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - 1999 |
Event | 7th International Conference of Magnetic Recording Media, MRM 1998 - Maastricht, Netherlands Duration: 30 Aug 1998 → 2 Sep 1998 Conference number: 7 |
Keywords
- SMI-MAT: MATERIALS
- SMI-TST: From 2006 in EWI-TST
- Thin films
- Substrate temperature
- Tantalum
- RF-sputtering