Sowariraj, M. S. B., Smedes, T., Salm, C., Mouthaan, A. J., & Kuper, F. G. (2002). The influence of technology variation on ggNMOST and SCRs against CDM ESD stress. Microelectronics reliability, 42, 1287-1292.
M.S.B. Sowariraj, T Smedes, Cora Salm, A.J. Mouthaan, F.G. Kuper
Research output: Contribution to journal › Article › Academic › peer-review