The influence of technology variation on ggNMOST and SCRs against CDM ESD stress

M.S.B. Sowariraj, T Smedes, Cora Salm, A.J. Mouthaan, F.G. Kuper

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)1287-1292
    Number of pages5
    JournalMicroelectronics reliability
    Volume42
    Publication statusPublished - 2002

    Keywords

    • METIS-207803

    Cite this

    Sowariraj, M. S. B., Smedes, T., Salm, C., Mouthaan, A. J., & Kuper, F. G. (2002). The influence of technology variation on ggNMOST and SCRs against CDM ESD stress. Microelectronics reliability, 42, 1287-1292.