The influence of technology variation on ggNMOST and SCRs against CDM ESD stress

M.S.B. Sowariraj, T Smedes, Cora Salm, A.J. Mouthaan, F.G. Kuper

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)1287-1292
    Number of pages5
    JournalMicroelectronics reliability
    Volume42
    Publication statusPublished - 2002

    Keywords

    • METIS-207803

    Cite this

    Sowariraj, M. S. B., Smedes, T., Salm, C., Mouthaan, A. J., & Kuper, F. G. (2002). The influence of technology variation on ggNMOST and SCRs against CDM ESD stress. Microelectronics reliability, 42, 1287-1292.
    Sowariraj, M.S.B. ; Smedes, T ; Salm, Cora ; Mouthaan, A.J. ; Kuper, F.G. / The influence of technology variation on ggNMOST and SCRs against CDM ESD stress. In: Microelectronics reliability. 2002 ; Vol. 42. pp. 1287-1292.
    @article{5289e806767c4e76832a8df7820503eb,
    title = "The influence of technology variation on ggNMOST and SCRs against CDM ESD stress",
    keywords = "METIS-207803",
    author = "M.S.B. Sowariraj and T Smedes and Cora Salm and A.J. Mouthaan and F.G. Kuper",
    year = "2002",
    language = "Undefined",
    volume = "42",
    pages = "1287--1292",
    journal = "Microelectronics reliability",
    issn = "0026-2714",
    publisher = "Elsevier",

    }

    Sowariraj, MSB, Smedes, T, Salm, C, Mouthaan, AJ & Kuper, FG 2002, 'The influence of technology variation on ggNMOST and SCRs against CDM ESD stress', Microelectronics reliability, vol. 42, pp. 1287-1292.

    The influence of technology variation on ggNMOST and SCRs against CDM ESD stress. / Sowariraj, M.S.B.; Smedes, T; Salm, Cora; Mouthaan, A.J.; Kuper, F.G.

    In: Microelectronics reliability, Vol. 42, 2002, p. 1287-1292.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - The influence of technology variation on ggNMOST and SCRs against CDM ESD stress

    AU - Sowariraj, M.S.B.

    AU - Smedes, T

    AU - Salm, Cora

    AU - Mouthaan, A.J.

    AU - Kuper, F.G.

    PY - 2002

    Y1 - 2002

    KW - METIS-207803

    M3 - Article

    VL - 42

    SP - 1287

    EP - 1292

    JO - Microelectronics reliability

    JF - Microelectronics reliability

    SN - 0026-2714

    ER -