The influence of technology variation on ggNMOST and SCRs against CDM ESD stress

Research output: Contribution to journal › Article › Academic › peer-review

Original language	Undefined
Pages (from-to)	1287-1292
Number of pages	5
Journal	Microelectronics reliability
Volume	42
Publication status	Published - 2002

Keywords

@article{5289e806767c4e76832a8df7820503eb,

title = "The influence of technology variation on ggNMOST and SCRs against CDM ESD stress",

keywords = "METIS-207803",

author = "M.S.B. Sowariraj and T Smedes and Cora Salm and A.J. Mouthaan and F.G. Kuper",

year = "2002",

language = "Undefined",

volume = "42",

pages = "1287--1292",

journal = "Microelectronics reliability",

issn = "0026-2714",

publisher = "Elsevier",

}