The interpretation of ellipsometric measurements of ion bombardment of noble gases on semiconductor surfaces

A.H.M. Holtslag, U.C. Slager, Arend van Silfhout

    Research output: Contribution to journal › Article › Academic

    10 Citations (Scopus)
    199 Downloads (Pure)

    Fingerprint

    Dive into the research topics of 'The interpretation of ellipsometric measurements of ion bombardment of noble gases on semiconductor surfaces'. Together they form a unique fingerprint.