The Modeling of Electromigration a New Challenge for TCAD?

W. Schoenmaker, V. Petrescu

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the SISPAD'98
    Place of PublicationLeuven, Belgie
    Pages328-331
    Number of pages4
    Publication statusPublished - 3 Sep 1998

    Keywords

    • METIS-113840

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