The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles

Christopher James Lee, Klaus J. Boller

Research output: Contribution to journalArticleAcademic

2 Citations (Scopus)

Abstract

With recent developments in microscopy, such as stimulated emission depletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we show that, in the special case of a diffusive regime, the noise-limited resolution of STED imaging is independent of the saturation intensity of the fluorescent label. Thermal motion limits the signal integration time, which, for a given excited-state lifetime, limits the total number of photons available for detection.
Original languageEnglish
Article number12793
Pages (from-to)1-6
Number of pages6
JournalVirtual journal for biomedical optics
Volume7
Issue number8
DOIs
Publication statusPublished - 2 Aug 2012

Keywords

  • METIS-287513
  • IR-81131

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