Abstract
With recent developments in microscopy, such as stimulated emission depletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we show that, in the special case of a diffusive regime, the noise-limited resolution of STED imaging is independent of the saturation intensity of the fluorescent label. Thermal motion limits the signal integration time, which, for a given excited-state lifetime, limits the total number of photons available for detection.
Original language | English |
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Article number | 12793 |
Pages (from-to) | 1-6 |
Number of pages | 6 |
Journal | Virtual journal for biomedical optics |
Volume | 7 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2 Aug 2012 |
Keywords
- METIS-287513
- IR-81131