@article{b44b8575e0ca4e4da0ad3924ac3d866b,
title = "The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles",
abstract = "With recent developments in microscopy, such as stimulated emission depletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we show that, in the special case of a diffusive regime, the noise-limited resolution of STED imaging is independent of the saturation intensity of the fluorescent label. Thermal motion limits the signal integration time, which, for a given excited-state lifetime, limits the total number of photons available for detection.",
author = "Lee, {Chris J.} and Boller, {Klaus J.}",
year = "2012",
doi = "10.1364/OE.20.012793",
language = "English",
volume = "20",
pages = "12793--12798",
journal = "Optics express",
issn = "1094-4087",
publisher = "Optica Publishing Group (formerly OSA)",
number = "12",
}