The observability radius of network systems

Gianluca Bianchin, Paolo Frasca, Andrea Gasparri, Fabio Pasqualetti

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)

    Abstract

    This paper introduces the observability radius of network systems, which measures the robustness of a network to perturbations of the edges. We consider linear networks, where the dynamics are described by a weighted adjacency matrix, and dedicated sensors are positioned at a subset of nodes. We allow for perturbations of certain edge weights, with the objective of preventing observability of some modes of the network dynamics. Our work considers perturbations with a desired sparsity structure, thus extending the classic literature on the controllability and observability radius of linear systems. We propose an optimization framework to determine a perturbation with smallest Frobenius norm that renders a desired mode unobservable from a given set of sensor nodes. We derive optimality conditions and a heuristic optimization algorithm, which we validate through an example.
    Original languageEnglish
    Title of host publicationAmerican Control Conference (ACC), 2016
    Place of PublicationPiscataway, NJ, USA
    PublisherIEEE
    Pages185-190
    Number of pages6
    ISBN (Print)978-1-4673-8683-8
    DOIs
    Publication statusPublished - 6 Jul 2016
    Event2016 American Control Conference, ACC 2016 - Boston, United States
    Duration: 6 Jul 20168 Jul 2016

    Publication series

    Name
    PublisherIEEE
    ISSN (Print)2378-5861

    Conference

    Conference2016 American Control Conference, ACC 2016
    Abbreviated titleACC
    CountryUnited States
    CityBoston
    Period6/07/168/07/16

    Keywords

    • EWI-27422
    • IR-102387
    • METIS-319481

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  • Cite this

    Bianchin, G., Frasca, P., Gasparri, A., & Pasqualetti, F. (2016). The observability radius of network systems. In American Control Conference (ACC), 2016 (pp. 185-190). Piscataway, NJ, USA: IEEE. https://doi.org/10.1109/ACC.2016.7524913