The Practical Use of a Defect-Oriented Approach in Mixed-Signal Testing

N. Engin, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationIEEE European Test Workshop
    Place of PublicationConstance, Germany
    Pages3/5-3/6
    Number of pages2
    Publication statusPublished - 1 May 1999

    Keywords

    • METIS-113039

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