The distribution of the hysteresis loss as a function of the applied field has been successfully used to investigate the magnetization reversal mechanism in our CoCr films. For high Hc/Hk films, the distribution of the hysteresis loss vs. applied field exhibits a monotonically decreasing curve with a single peak, while for a low and medium Hc/Hk films their curves exhibit double-peak characteristics. On assuming that the magnetization reversal in low Hc/Hk films is considered as the superposition of the domain-wall motion with perpendicular an in-plane orientation of the magnetization, then the calculated coercivity vs. angle curve is in good agreement with the measured one. A simple and convenient method for determining the nucleation field is also provided.
- SMI-TST: From 2006 in EWI-TST
- SMI-MAT: MATERIALS