The role of MFM signal in mark size measurement in probe-based magnetic recording on CoNi/Pt multilayers

Li Zhang, James A. Bain, Jian-Gang Zhu, Leon Abelmann, T. Onoue

    Research output: Contribution to journalArticleAcademicpeer-review

    7 Citations (Scopus)

    Abstract

    A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. Magnetic marks were formed by a scanning tunneling microscopy (STM)-based thermal magnetic mechanism on a perpendicular CoNi/Pt multilayered film. Magnetic force microscopy (MFM) was applied to display those marks. The MFM signal is dependent of the lift-height during MFM scanning: smaller lift-height leads to higher resolution of the MFM image and a double-peak signal line, while higher lift-height leads to lower resolution and a single-peak signal line. Theoretical calculation of the magnetic field from the mark was executed. It agrees well with experiments, and demonstrates the method of mark size measurement in perpendicular media: full-width half-maximum (FWHM) of the measured MFM signal.
    Original languageUndefined
    Article number10.1016/j.physb.2006.04.028
    Pages (from-to)328-332
    Number of pages5
    JournalPhysica B
    Volume387
    Issue numberP2773/1-2
    DOIs
    Publication statusPublished - 2007

    Keywords

    • IR-64033
    • TST-MFM: Magnetic Force Microscope
    • TST-SMI: Formerly in EWI-SMI
    • EWI-9867
    • TST-uSPAM: micro Scanning Probe Array Memory
    • METIS-242174

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