The role of STM tip shape in heat assisted magnetic probe recording on CoNi/Pt film

Li Zhang; James A. Bain; Jian Gang Zhu; Leon Abelmann; Takahiro Onoue

doi:10.1115/NANO2004-46057

The role of STM tip shape in heat assisted magnetic probe recording on CoNi/Pt film

Li Zhang^*, James A. Bain, Jian Gang Zhu, Leon Abelmann, Takahiro Onoue

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

2 Citations (Scopus)

Abstract

A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. In this work, field emission current from a scanning tunneling microscope (STM) tip is used as the heating source. The tip is made of Ir/Pt alloy. Pulse voltages of 3-7 V with a duration of 500ns were applied to a CoNi/Pt multilayered film. Written by a blunt tip (radius 1000nm), marks are formed with a nearly uniform mark size of 170nm when the pulse voltage is above 4 V. While sharp tip (radius 50 nm) writing achieves no mark. The emission area of our tipsample system derived from an analytic expression for field emission current is approximately equal to the mark size, and is largely independent of pulse voltage. For the blunt tip, the emission region is almost the same as the mark size. While for the sharp tip, the initially formed mark is too small, so that the domain wall surface tension shrinks the mark and it crashes finally.

Original language	English
Title of host publication	Integrated Nanosystems
Subtitle of host publication	Design, Synthesis, and Applications
Publisher	American Society of Mechanical Engineers
Pages	41-44
Number of pages	4
ISBN (Print)	0-7918-4177-4
DOIs	https://doi.org/10.1115/NANO2004-46057
Publication status	Published - 1 Dec 2004
Event	3rd ASME Integrated Nanosystems Conference 2004: Design, Synthesis, and Applications - Pasadena, United States Duration: 22 Sept 2004 → 24 Sept 2004 Conference number: 3

Conference

Conference	3rd ASME Integrated Nanosystems Conference 2004
Country/Territory	United States
City	Pasadena
Period	22/09/04 → 24/09/04

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@inproceedings{a4e517ecf3bd4253b061c9a276e8fbbf,

title = "The role of STM tip shape in heat assisted magnetic probe recording on CoNi/Pt film",

abstract = "A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. In this work, field emission current from a scanning tunneling microscope (STM) tip is used as the heating source. The tip is made of Ir/Pt alloy. Pulse voltages of 3-7 V with a duration of 500ns were applied to a CoNi/Pt multilayered film. Written by a blunt tip (radius 1000nm), marks are formed with a nearly uniform mark size of 170nm when the pulse voltage is above 4 V. While sharp tip (radius 50 nm) writing achieves no mark. The emission area of our tipsample system derived from an analytic expression for field emission current is approximately equal to the mark size, and is largely independent of pulse voltage. For the blunt tip, the emission region is almost the same as the mark size. While for the sharp tip, the initially formed mark is too small, so that the domain wall surface tension shrinks the mark and it crashes finally.",

author = "Li Zhang and Bain, {James A.} and Zhu, {Jian Gang} and Leon Abelmann and Takahiro Onoue",

year = "2004",

month = dec,

day = "1",

doi = "10.1115/NANO2004-46057",

language = "English",

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pages = "41--44",

booktitle = "Integrated Nanosystems",

publisher = "American Society of Mechanical Engineers",

address = "United States",

note = "3rd ASME Integrated Nanosystems Conference 2004 : Design, Synthesis, and Applications ; Conference date: 22-09-2004 Through 24-09-2004",

}

Zhang, L, Bain, JA, Zhu, JG, Abelmann, L & Onoue, T 2004, The role of STM tip shape in heat assisted magnetic probe recording on CoNi/Pt film. in Integrated Nanosystems: Design, Synthesis, and Applications., NANO2004-46057, American Society of Mechanical Engineers, pp. 41-44, 3rd ASME Integrated Nanosystems Conference 2004, Pasadena, California, United States, 22/09/04. https://doi.org/10.1115/NANO2004-46057

The role of STM tip shape in heat assisted magnetic probe recording on CoNi/Pt film. / Zhang, Li; Bain, James A.; Zhu, Jian Gang et al.
Integrated Nanosystems: Design, Synthesis, and Applications. American Society of Mechanical Engineers, 2004. p. 41-44 NANO2004-46057.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - The role of STM tip shape in heat assisted magnetic probe recording on CoNi/Pt film

AU - Zhang, Li

AU - Bain, James A.

AU - Zhu, Jian Gang

AU - Abelmann, Leon

AU - Onoue, Takahiro

N1 - Conference code: 3

PY - 2004/12/1

Y1 - 2004/12/1

N2 - A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. In this work, field emission current from a scanning tunneling microscope (STM) tip is used as the heating source. The tip is made of Ir/Pt alloy. Pulse voltages of 3-7 V with a duration of 500ns were applied to a CoNi/Pt multilayered film. Written by a blunt tip (radius 1000nm), marks are formed with a nearly uniform mark size of 170nm when the pulse voltage is above 4 V. While sharp tip (radius 50 nm) writing achieves no mark. The emission area of our tipsample system derived from an analytic expression for field emission current is approximately equal to the mark size, and is largely independent of pulse voltage. For the blunt tip, the emission region is almost the same as the mark size. While for the sharp tip, the initially formed mark is too small, so that the domain wall surface tension shrinks the mark and it crashes finally.

AB - A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. In this work, field emission current from a scanning tunneling microscope (STM) tip is used as the heating source. The tip is made of Ir/Pt alloy. Pulse voltages of 3-7 V with a duration of 500ns were applied to a CoNi/Pt multilayered film. Written by a blunt tip (radius 1000nm), marks are formed with a nearly uniform mark size of 170nm when the pulse voltage is above 4 V. While sharp tip (radius 50 nm) writing achieves no mark. The emission area of our tipsample system derived from an analytic expression for field emission current is approximately equal to the mark size, and is largely independent of pulse voltage. For the blunt tip, the emission region is almost the same as the mark size. While for the sharp tip, the initially formed mark is too small, so that the domain wall surface tension shrinks the mark and it crashes finally.

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ER -

The role of STM tip shape in heat assisted magnetic probe recording on CoNi/Pt film

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