The role of STM tip shape in heat assisted magnetic probe recording on CoNi/Pt film

Li Zhang*, James A. Bain, Jian Gang Zhu, Leon Abelmann, Takahiro Onoue

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Abstract

    A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. In this work, field emission current from a scanning tunneling microscope (STM) tip is used as the heating source. The tip is made of Ir/Pt alloy. Pulse voltages of 3-7 V with a duration of 500ns were applied to a CoNi/Pt multilayered film. Written by a blunt tip (radius 1000nm), marks are formed with a nearly uniform mark size of 170nm when the pulse voltage is above 4 V. While sharp tip (radius 50 nm) writing achieves no mark. The emission area of our tipsample system derived from an analytic expression for field emission current is approximately equal to the mark size, and is largely independent of pulse voltage. For the blunt tip, the emission region is almost the same as the mark size. While for the sharp tip, the initially formed mark is too small, so that the domain wall surface tension shrinks the mark and it crashes finally.

    Original languageEnglish
    Title of host publicationIntegrated Nanosystems
    Subtitle of host publicationDesign, Synthesis, and Applications
    Pages41-44
    Number of pages4
    Publication statusPublished - 1 Dec 2004
    Event3rd ASME Integrated Nanosystems Conference 2004: Design, Synthesis, and Applications - Pasadena, United States
    Duration: 22 Sep 200424 Sep 2004
    Conference number: 3

    Conference

    Conference3rd ASME Integrated Nanosystems Conference 2004
    CountryUnited States
    CityPasadena
    Period22/09/0424/09/04

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