The safe operating volume as a general measure for the operating limits of LDMOS transistors

A. Ferrara, P.G. Steeneken, A. Heringa, B.K. Boksteen, M. Swanenberg, A.J. Scholten, L. van Dijk, Jurriaan Schmitz, Raymond Josephus Engelbart Hueting

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)

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