The simultanous measurement of firction and topography at extremely thin films

H. Visscher, P.J. Grundy, Dirk J. Schipper

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    11 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings 18th International IRG-OECD conference
    Place of PublicationAmsterdam
    Publication statusPublished - 8 Feb 1994


    • METIS-145638

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