The test ability of an adaptive pulse wave for ADC testing

Xiaoqin Sheng, Hans G. Kerkhoff

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    Abstract

    In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-to-Digital Converter (ADC), which is expensive to generate. Nowadays, an increasing number of ADCs are integrated into a system-on-chip (SoC) platform design, which usually contains a digital embedded processor. In such a platform, a digital pulse wave is obviously less expensive to generate than an accurate analogue sine wave. As a result, the usage of a digital pulse wave has been investigated to test ADCs as the test stimulus. In this paper, the ability of a digital adaptive pulse wave for ADC testing is presented via the measurement results. Instead of the conventional FFT analysis, a time-domain analysis is exploited for post-processing, from which a signature result can be obtained. This signature can distinguish between faulty devices and the fault-free devices. It is also used in the machine-learning-based test method to predict the dynamic specifications of the ADC. The experimental results of a 12-bit 80 M/s pipelined ADC are shown to evaluate the sensitivity and accuracy of using a pulse wave to test an ADC.
    Original languageUndefined
    Title of host publicationProceedings of the IEEE 19th Asian Test Symposium (ATS 2010)
    Place of PublicationWashington, DC, USA
    PublisherIEEE Computer Society
    Pages289-294
    Number of pages6
    ISBN (Print)978-0-7695-4248-5
    DOIs
    Publication statusPublished - 1 Dec 2010
    EventIEEE 19th Asian Test Symposium, ATS 2010 - Shanghai, China
    Duration: 1 Dec 20104 Dec 2010

    Publication series

    Name
    PublisherIEEE Computer Society

    Conference

    ConferenceIEEE 19th Asian Test Symposium, ATS 2010
    Period1/12/104/12/10
    Other1-4 December 2010

    Keywords

    • METIS-277474
    • Measurement
    • ADC
    • IR-75343
    • EWI-19178
    • signature
    • machine-learning-based
    • Test
    • pulse wave

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