The Test-Cycle Minimisation in Parametrised Bus-Oriented Datapath Designs

V. Zivkovic, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publication1st IEEE Latin American Test Workshop
    Place of PublicationRio de Janeiro, Brazil
    Pages-
    Publication statusPublished - 13 Mar 2000

    Keywords

    • METIS-113014

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