The Test-Cycle Minimisation in Parametrised Bus-Oriented Datapath Designs

V. Zivkovic, R.J.W.T. Tangelder, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publication1st IEEE Latin American Test Workshop
    Place of PublicationRio de Janeiro, Brazil
    Pages-
    Publication statusPublished - 13 Mar 2000

    Keywords

    • METIS-113014

    Cite this

    Zivkovic, V., Tangelder, R. J. W. T., & Kerkhoff, H. G. (2000). The Test-Cycle Minimisation in Parametrised Bus-Oriented Datapath Designs. In 1st IEEE Latin American Test Workshop (pp. -). Rio de Janeiro, Brazil.