The Testing of High-Speed Josephson-Junction Circuits

Hans G. Kerkhoff, H. Speek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of Prorisc 2000
    Place of PublicationVeldhoven, The Netherlands
    Pages317-322
    Publication statusPublished - 30 Nov 2000

    Keywords

    • METIS-113026

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