The Time-Voltage Trade-off for ESD Damage Threshold in Amorphous Silicon Hydrogenated Thin-film Transistors

N. Golo-Tosic, S. van der Wal, F.G. Kuper, A.J. Mouthaan

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)1391-1396
    Number of pages6
    JournalMicroelectronics reliability
    Volume41
    Issue number9-10
    Publication statusPublished - 2001

    Keywords

    • METIS-201443

    Cite this

    Golo-Tosic, N., van der Wal, S., Kuper, F. G., & Mouthaan, A. J. (2001). The Time-Voltage Trade-off for ESD Damage Threshold in Amorphous Silicon Hydrogenated Thin-film Transistors. Microelectronics reliability, 41(9-10), 1391-1396.
    Golo-Tosic, N. ; van der Wal, S. ; Kuper, F.G. ; Mouthaan, A.J. / The Time-Voltage Trade-off for ESD Damage Threshold in Amorphous Silicon Hydrogenated Thin-film Transistors. In: Microelectronics reliability. 2001 ; Vol. 41, No. 9-10. pp. 1391-1396.
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    title = "The Time-Voltage Trade-off for ESD Damage Threshold in Amorphous Silicon Hydrogenated Thin-film Transistors",
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    author = "N. Golo-Tosic and {van der Wal}, S. and F.G. Kuper and A.J. Mouthaan",
    year = "2001",
    language = "Undefined",
    volume = "41",
    pages = "1391--1396",
    journal = "Microelectronics reliability",
    issn = "0026-2714",
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    Golo-Tosic, N, van der Wal, S, Kuper, FG & Mouthaan, AJ 2001, 'The Time-Voltage Trade-off for ESD Damage Threshold in Amorphous Silicon Hydrogenated Thin-film Transistors' Microelectronics reliability, vol. 41, no. 9-10, pp. 1391-1396.

    The Time-Voltage Trade-off for ESD Damage Threshold in Amorphous Silicon Hydrogenated Thin-film Transistors. / Golo-Tosic, N.; van der Wal, S.; Kuper, F.G.; Mouthaan, A.J.

    In: Microelectronics reliability, Vol. 41, No. 9-10, 2001, p. 1391-1396.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - The Time-Voltage Trade-off for ESD Damage Threshold in Amorphous Silicon Hydrogenated Thin-film Transistors

    AU - Golo-Tosic, N.

    AU - van der Wal, S.

    AU - Kuper, F.G.

    AU - Mouthaan, A.J.

    PY - 2001

    Y1 - 2001

    KW - METIS-201443

    M3 - Article

    VL - 41

    SP - 1391

    EP - 1396

    JO - Microelectronics reliability

    JF - Microelectronics reliability

    SN - 0026-2714

    IS - 9-10

    ER -