The transient behaviour of an input protection

K. de Kort, J.R.M. Luchies, J.J. Vrehen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices
    Place of PublicationSwiss Federal Inst. of Technology (ETH) Zurich, Sw
    Pages7.15-7.18
    Publication statusPublished - 1 Sep 1993

    Keywords

    • METIS-113994

    Cite this

    de Kort, K., Luchies, J. R. M., & Vrehen, J. J. (1993). The transient behaviour of an input protection. In Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices (pp. 7.15-7.18). Swiss Federal Inst. of Technology (ETH) Zurich, Sw.