The transient behaviour of an input protection

K. de Kort, J.R.M. Luchies, J.J. Vrehen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices
    Place of PublicationSwiss Federal Inst. of Technology (ETH) Zurich, Sw
    Pages7.15-7.18
    Publication statusPublished - 1 Sep 1993

    Keywords

    • METIS-113994

    Cite this

    de Kort, K., Luchies, J. R. M., & Vrehen, J. J. (1993). The transient behaviour of an input protection. In Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices (pp. 7.15-7.18). Swiss Federal Inst. of Technology (ETH) Zurich, Sw.
    de Kort, K. ; Luchies, J.R.M. ; Vrehen, J.J. / The transient behaviour of an input protection. Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices. Swiss Federal Inst. of Technology (ETH) Zurich, Sw, 1993. pp. 7.15-7.18
    @inproceedings{ed3956be41d84caab4c07d85ce324a04,
    title = "The transient behaviour of an input protection",
    keywords = "METIS-113994",
    author = "{de Kort}, K. and J.R.M. Luchies and J.J. Vrehen",
    year = "1993",
    month = "9",
    day = "1",
    language = "Undefined",
    pages = "7.15--7.18",
    booktitle = "Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices",

    }

    de Kort, K, Luchies, JRM & Vrehen, JJ 1993, The transient behaviour of an input protection. in Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices. Swiss Federal Inst. of Technology (ETH) Zurich, Sw, pp. 7.15-7.18.

    The transient behaviour of an input protection. / de Kort, K.; Luchies, J.R.M.; Vrehen, J.J.

    Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices. Swiss Federal Inst. of Technology (ETH) Zurich, Sw, 1993. p. 7.15-7.18.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - The transient behaviour of an input protection

    AU - de Kort, K.

    AU - Luchies, J.R.M.

    AU - Vrehen, J.J.

    PY - 1993/9/1

    Y1 - 1993/9/1

    KW - METIS-113994

    M3 - Conference contribution

    SP - 7.15-7.18

    BT - Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices

    CY - Swiss Federal Inst. of Technology (ETH) Zurich, Sw

    ER -

    de Kort K, Luchies JRM, Vrehen JJ. The transient behaviour of an input protection. In Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices. Swiss Federal Inst. of Technology (ETH) Zurich, Sw. 1993. p. 7.15-7.18