The transient behaviour of an input protection

K. de Kort, J.R.M. Luchies, J.J. Vrehen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices
    Place of PublicationSwiss Federal Inst. of Technology (ETH) Zurich, Sw
    Publication statusPublished - 1 Sept 1993


    • METIS-113994

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