The transient behaviour of an input protection

Kees de Kort, Jan Marc Luchies, J.R.M. Luchies, J.J. Vrehen

    Research output: Contribution to journalArticleAcademicpeer-review

    70 Downloads (Pure)

    Abstract

    The high frequency behaviour of input protections has been measured with electro-optic sampling. These measurements allow the determination of the time dependence of the voltages at internal nodes as well as the time dependence of the current through the input protection. Simulations are performed using a detailed model of the input protection and a simplified model of the integrated circuit, including connections. The measurements are vital to the development of the model, which ultimately aims at explaining the differences found in Human Body Model testing and Charged Device Model testing.
    Original languageUndefined
    Pages (from-to)355-362
    JournalMicroelectronic engineering
    Volume24
    Issue number1-4
    DOIs
    Publication statusPublished - 1994

    Keywords

    • IR-15189
    • METIS-112063

    Cite this