The transient behaviour of an input protection

K. de Kort; J.R.M. Luchies; J.J. Vrehen

The transient behaviour of an input protection

K. de Kort, J.R.M. Luchies, J.J. Vrehen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices
Place of Publication	Swiss Federal Inst. of Technology (ETH) Zurich, Sw
Pages	7.15-7.18
Publication status	Published - 1 Sept 1993

Keywords

METIS-113994

Cite this

@inproceedings{ed3956be41d84caab4c07d85ce324a04,

title = "The transient behaviour of an input protection",

keywords = "METIS-113994",

author = "\{de Kort\}, K. and J.R.M. Luchies and J.J. Vrehen",

year = "1993",

month = sep,

day = "1",

language = "Undefined",

pages = "7.15--7.18",

booktitle = "Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices",

}

The transient behaviour of an input protection. / de Kort, K.; Luchies, J.R.M.; Vrehen, J.J.
Proceedings 4th European Conference on Electron and Optical Beam Testing of Electronic Devices. Swiss Federal Inst. of Technology (ETH) Zurich, Sw, 1993. p. 7.15-7.18.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review