Abstract
The interface resistances of magnetic multilayers are calculated without any adjustable parameters by combining first-principles electronic structure calculations with the Boltzmann equation. The microscopic mechanism of specular interface scattering in combination with diffuse bulk scattering can largely explain the experimentally observed values for the interface resistances of Co/Cu multilayers.
| Original language | English |
|---|---|
| Pages (from-to) | 1166-1167 |
| Number of pages | 2 |
| Journal | Journal of magnetism and magnetic materials |
| Volume | 177-181 |
| Issue number | Part 2 |
| DOIs | |
| Publication status | Published - 1998 |
Keywords
- n/a OA procedure
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