Thermal instability in two-finger bipolar transistors

N. Nenadovic; V. D'Alessandro; F. Tamigi; A. Rossi; A. Griffo; L. K. Nanver; J. W. Slotboom

doi:10.1109/ESSDERC.2003.1256849

Thermal instability in two-finger bipolar transistors

N. Nenadovic^*, V. D'Alessandro, F. Tamigi, A. Rossi, A. Griffo, L. K. Nanver, J. W. Slotboom

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

12 Citations (Scopus)

Abstract

A novel analytical formulation for the biasing condition leading to thermal instability in a two-finger bipolar transistor is derived. The temperature dependence of the current gain as well as the mutual thermal coupling is accounted for. Different technologies are compared by varying the model parameters. It is demonstrated that SiGe devices are more thermally stable than comparable Si devices. Finally, the influence of the substrate modification on thermal instability is investigated. It is shown that thermally conducting substrates are needed to electro-thermally stabilize bipolar transistors.

Original language	English
Title of host publication	ESSDERC 2003 - Proceedings of the 33rd European Solid-State Device Research Conference
Editors	Jose Franca, Paulo Freitas
Publisher	IEEE
Pages	203-206
Number of pages	4
ISBN (Print)	9780780379992
DOIs	https://doi.org/10.1109/ESSDERC.2003.1256849
Publication status	Published - 1 Jan 2003
Externally published	Yes
Event	33rd European Solid-State Device Research Conference, ESSDERC 2003 - Lisboa, Portugal Duration: 16 Sept 2003 → 18 Sept 2003 Conference number: 33

Conference

Conference	33rd European Solid-State Device Research Conference, ESSDERC 2003
Abbreviated title	ESSDERC
Country/Territory	Portugal
City	Lisboa
Period	16/09/03 → 18/09/03

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10.1109/ESSDERC.2003.1256849

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@inproceedings{e45d8bf7b7bc4dd9bd72419bc34fb84a,

title = "Thermal instability in two-finger bipolar transistors",

abstract = "A novel analytical formulation for the biasing condition leading to thermal instability in a two-finger bipolar transistor is derived. The temperature dependence of the current gain as well as the mutual thermal coupling is accounted for. Different technologies are compared by varying the model parameters. It is demonstrated that SiGe devices are more thermally stable than comparable Si devices. Finally, the influence of the substrate modification on thermal instability is investigated. It is shown that thermally conducting substrates are needed to electro-thermally stabilize bipolar transistors.",

author = "N. Nenadovic and V. D'Alessandro and F. Tamigi and A. Rossi and A. Griffo and Nanver, {L. K.} and Slotboom, {J. W.}",

year = "2003",

month = jan,

day = "1",

doi = "10.1109/ESSDERC.2003.1256849",

language = "English",

isbn = "9780780379992",

pages = "203--206",

editor = "Jose Franca and Paulo Freitas",

booktitle = "ESSDERC 2003 - Proceedings of the 33rd European Solid-State Device Research Conference",

publisher = "IEEE",

address = "United States",

note = "33rd European Solid-State Device Research Conference, ESSDERC 2003, ESSDERC ; Conference date: 16-09-2003 Through 18-09-2003",

}

Nenadovic, N, D'Alessandro, V, Tamigi, F, Rossi, A, Griffo, A, Nanver, LK & Slotboom, JW 2003, Thermal instability in two-finger bipolar transistors. in J Franca & P Freitas (eds), ESSDERC 2003 - Proceedings of the 33rd European Solid-State Device Research Conference., 1256849, IEEE, pp. 203-206, 33rd European Solid-State Device Research Conference, ESSDERC 2003, Lisboa, Portugal, 16/09/03. https://doi.org/10.1109/ESSDERC.2003.1256849

Thermal instability in two-finger bipolar transistors. / Nenadovic, N.; D'Alessandro, V.; Tamigi, F. et al.
ESSDERC 2003 - Proceedings of the 33rd European Solid-State Device Research Conference. ed. / Jose Franca; Paulo Freitas. IEEE, 2003. p. 203-206 1256849.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Thermal instability in two-finger bipolar transistors

AU - Nenadovic, N.

AU - D'Alessandro, V.

AU - Tamigi, F.

AU - Rossi, A.

AU - Griffo, A.

AU - Nanver, L. K.

AU - Slotboom, J. W.

N1 - Conference code: 33

PY - 2003/1/1

Y1 - 2003/1/1

N2 - A novel analytical formulation for the biasing condition leading to thermal instability in a two-finger bipolar transistor is derived. The temperature dependence of the current gain as well as the mutual thermal coupling is accounted for. Different technologies are compared by varying the model parameters. It is demonstrated that SiGe devices are more thermally stable than comparable Si devices. Finally, the influence of the substrate modification on thermal instability is investigated. It is shown that thermally conducting substrates are needed to electro-thermally stabilize bipolar transistors.

AB - A novel analytical formulation for the biasing condition leading to thermal instability in a two-finger bipolar transistor is derived. The temperature dependence of the current gain as well as the mutual thermal coupling is accounted for. Different technologies are compared by varying the model parameters. It is demonstrated that SiGe devices are more thermally stable than comparable Si devices. Finally, the influence of the substrate modification on thermal instability is investigated. It is shown that thermally conducting substrates are needed to electro-thermally stabilize bipolar transistors.

UR - http://www.scopus.com/inward/record.url?scp=70449600239&partnerID=8YFLogxK

U2 - 10.1109/ESSDERC.2003.1256849

DO - 10.1109/ESSDERC.2003.1256849

M3 - Conference contribution

AN - SCOPUS:70449600239

SN - 9780780379992

SP - 203

EP - 206

BT - ESSDERC 2003 - Proceedings of the 33rd European Solid-State Device Research Conference

A2 - Franca, Jose

A2 - Freitas, Paulo

PB - IEEE

T2 - 33rd European Solid-State Device Research Conference, ESSDERC 2003

Y2 - 16 September 2003 through 18 September 2003

ER -

Thermal instability in two-finger bipolar transistors

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