Thermally induced reversible easy axis rotations in permalloy thin films

Winfried H.G. Horsthuis, C.J.M. Eijkel, R.M. de Ridder, Henk Leeuwis

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    Abstract

    The thermal stability of the easy axis orientation in thin Permalloy films was studied. This orientation was measured by two methods, i.e. the magneto-optic Kerr effect and a novel measurement scheme based on magnetoresistive effects. It appeared that even for small temperature changes rotations of the easy axis occured. Together with the commonly observed irreversible rotations (thermal annealing), reversible rotations were also measured. Variation of film composition, substrate layer and different annealing steps were tried to obtain a better understanding of this unexpected behaviour. No well-defined correlation could be established between the varied parameters and thermal behaviour
    Original languageUndefined
    Pages (from-to)375-382
    JournalThin solid films
    Volume162
    DOIs
    Publication statusPublished - 1988

    Keywords

    • IR-70315

    Cite this

    Horsthuis, W. H. G., Eijkel, C. J. M., de Ridder, R. M., & Leeuwis, H. (1988). Thermally induced reversible easy axis rotations in permalloy thin films. Thin solid films, 162, 375-382. https://doi.org/10.1016/0040-6090(88)90226-X