Thickness dependence of structural,magnetic properties and reversal mechanism of Co Cr Ta/Cr longitudinal recording media

P.L.K. Phan le kim; J.C. Lodder

doi:10.1016/S0304-8853(01)01234-3

Thickness dependence of structural,magnetic properties and reversal mechanism of Co Cr Ta/Cr longitudinal recording media

P.L.K. Phan le kim, J.C. Lodder

Research output: Contribution to journal › Article › Academic › peer-review

5 Citations (Scopus)

Abstract

In this paper,a series of five samples of X nm Co Cr Ta/100 nm Cr (X 10 2 100 nm) longitudinal recording media was studied.The relationships between structural, magnetic properties and the reversal mechanism were investigated and discussed.It was found that the maximums of coercivity and squarenesses occur at Co Cr Ta layer thickness of 20 nm, which is considered the optimum thickness for recording.

Original language	Undefined
Pages (from-to)	395-397
Number of pages	3
Journal	Journal of magnetism and magnetic materials
Volume	242-245
Issue number	Part 1
DOIs	https://doi.org/10.1016/S0304-8853(01)01234-3
Publication status	Published - 2002

Keywords

Crystal structure
Reversal mechanism
EWI-5487
SMI-TST: From 2006 in EWI-TST
SMI-MAT: MATERIALS
METIS-206315
IR-62978
Angular dependence
Magnetic recording media
Coercivity

Access to Document

10.1016/S0304-8853(01)01234-3

http://eprints.eemcs.utwente.nl/secure2/5487/01/KIM2002A.PDF

Cite this

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title = "Thickness dependence of structural,magnetic properties and reversal mechanism of Co Cr Ta/Cr longitudinal recording media",

abstract = "In this paper,a series of five samples of X nm Co Cr Ta/100 nm Cr (X 10 2 100 nm) longitudinal recording media was studied.The relationships between structural, magnetic properties and the reversal mechanism were investigated and discussed.It was found that the maximums of coercivity and squarenesses occur at Co Cr Ta layer thickness of 20 nm, which is considered the optimum thickness for recording.",

keywords = "Crystal structure, Reversal mechanism, EWI-5487, SMI-TST: From 2006 in EWI-TST, SMI-MAT: MATERIALS, METIS-206315, IR-62978, Angular dependence, Magnetic recording media, Coercivity",

author = "{Phan le kim}, P.L.K. and J.C. Lodder",

note = "Imported from SMI Reference manager",

year = "2002",

doi = "10.1016/S0304-8853(01)01234-3",

language = "Undefined",

volume = "242-245",

pages = "395--397",

journal = "Journal of magnetism and magnetic materials",

issn = "0304-8853",

publisher = "Elsevier",

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TY - JOUR

T1 - Thickness dependence of structural,magnetic properties and reversal mechanism of Co Cr Ta/Cr longitudinal recording media

AU - Phan le kim, P.L.K.

AU - Lodder, J.C.

N1 - Imported from SMI Reference manager

PY - 2002

Y1 - 2002

N2 - In this paper,a series of five samples of X nm Co Cr Ta/100 nm Cr (X 10 2 100 nm) longitudinal recording media was studied.The relationships between structural, magnetic properties and the reversal mechanism were investigated and discussed.It was found that the maximums of coercivity and squarenesses occur at Co Cr Ta layer thickness of 20 nm, which is considered the optimum thickness for recording.

AB - In this paper,a series of five samples of X nm Co Cr Ta/100 nm Cr (X 10 2 100 nm) longitudinal recording media was studied.The relationships between structural, magnetic properties and the reversal mechanism were investigated and discussed.It was found that the maximums of coercivity and squarenesses occur at Co Cr Ta layer thickness of 20 nm, which is considered the optimum thickness for recording.

KW - Crystal structure

KW - Reversal mechanism

KW - EWI-5487

KW - SMI-TST: From 2006 in EWI-TST

KW - SMI-MAT: MATERIALS

KW - METIS-206315

KW - IR-62978

KW - Angular dependence

KW - Magnetic recording media

KW - Coercivity

U2 - 10.1016/S0304-8853(01)01234-3

DO - 10.1016/S0304-8853(01)01234-3

M3 - Article

VL - 242-245

SP - 395

EP - 397

JO - Journal of magnetism and magnetic materials

JF - Journal of magnetism and magnetic materials

SN - 0304-8853

IS - Part 1

ER -