Thickness dependence of structural,magnetic properties and reversal mechanism of Co Cr Ta/Cr longitudinal recording media

P.L.K. Phan le kim, J.C. Lodder

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    5 Citations (Scopus)

    Abstract

    In this paper,a series of five samples of X nm Co Cr Ta/100 nm Cr (X 10 2 100 nm) longitudinal recording media was studied.The relationships between structural, magnetic properties and the reversal mechanism were investigated and discussed.It was found that the maximums of coercivity and squarenesses occur at Co Cr Ta layer thickness of 20 nm, which is considered the optimum thickness for recording.
    Original languageUndefined
    Pages (from-to)395-397
    Number of pages3
    JournalJournal of magnetism and magnetic materials
    Volume242-245
    Issue numberPart 1
    DOIs
    Publication statusPublished - 2002

    Keywords

    • Crystal structure
    • Reversal mechanism
    • EWI-5487
    • SMI-TST: From 2006 in EWI-TST
    • SMI-MAT: MATERIALS
    • METIS-206315
    • IR-62978
    • Angular dependence
    • Magnetic recording media
    • Coercivity

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