Abstract
In this paper,a series of five samples of X nm Co Cr Ta/100 nm Cr (X 10 2 100 nm) longitudinal recording media was studied.The relationships between structural, magnetic properties and the reversal mechanism were investigated and discussed.It was found that the maximums of coercivity and squarenesses occur at Co Cr Ta layer thickness of 20 nm, which is considered the optimum thickness for recording.
Original language | Undefined |
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Pages (from-to) | 395-397 |
Number of pages | 3 |
Journal | Journal of magnetism and magnetic materials |
Volume | 242-245 |
Issue number | Part 1 |
DOIs | |
Publication status | Published - 2002 |
Keywords
- Crystal structure
- Reversal mechanism
- EWI-5487
- SMI-TST: From 2006 in EWI-TST
- SMI-MAT: MATERIALS
- METIS-206315
- IR-62978
- Angular dependence
- Magnetic recording media
- Coercivity