Third Order Distortion Measurement Circuit for CMOS Transconductors

J. Nieland, Eric A.M. Klumperink, Adrianus Johannes Maria van Tuijl

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{3f944f36a4bf45eb9b06a58f24556248,

title = "Third Order Distortion Measurement Circuit for CMOS Transconductors",

keywords = "METIS-112830",

author = "J. Nieland and Klumperink, {Eric A.M.} and {van Tuijl}, {Adrianus Johannes Maria}",

year = "1997",

month = nov,

day = "27",

language = "Undefined",

isbn = "90-73461-12-X",

pages = "435--441",

booktitle = "Unknown",

}