Three dimensional adhesion model for arbitrary rough surfaces

S. Deladi, G. Krijnen, N. Tas, M. Elwenspoek

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)
    27 Downloads (Pure)


    We present a 3D adhesion model based on the JKR theory applied locally for all contacting asperity couple and the calculations account the van der Waals interaction beside the externally applied force. Thus, equilibrium of the system is determined by an extremum in the free total energy and subsequently the contact and the adhesion parameters are computed for that particular position. The model estimates the adhesion of contacting arbitrary rough surfaces taking into account that asperities deform according to one of the three deformation regimes (elastic, elasto-plastic and plastic). The deformation of the contacting asperities is determined by the material properties, the asperity characteristics as well as the surface topography. Results show that even outside the bonding regime the specific bonding energy is still high enough to cause adhesive problems for microstructures.
    Original languageEnglish
    Title of host publicationInternational Conference on Computational Nanoscience and Nanotechnology - ICCN 2002
    Subtitle of host publicationApril 21-25, 2002, San Juan Marriott Resort and Stellaris Casino, San Juan, Puerto Rico, USA
    Place of PublicationCambridge, MA
    PublisherComputational Publications
    Number of pages4
    ISBN (Print)0-9708275-6-3
    Publication statusPublished - 21 Apr 2002
    EventInternational Conference on Computational Nanoscience and Nanotechnology, ICCN 2002 - San Juan, Puerto Rico, United States
    Duration: 21 Apr 200225 Apr 2002


    ConferenceInternational Conference on Computational Nanoscience and Nanotechnology, ICCN 2002
    Abbreviated titleICCN
    Country/TerritoryUnited States
    CitySan Juan, Puerto Rico


    • Adhesion model
    • Surface topography
    • Bonding energy
    • Deformation regime
    • Microstructures


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