Abstract
We present a 3D adhesion model based on the JKR theory applied locally for all contacting asperity couple and the calculations account the van der Waals interaction beside the externally applied force. Thus, equilibrium of the system is determined by an extremum in the free total energy and subsequently the contact and the adhesion parameters are computed for that particular position. The model estimates the adhesion of contacting arbitrary rough surfaces taking into account that asperities deform according to one of the three deformation regimes (elastic, elasto-plastic and plastic). The deformation of the contacting asperities is determined by the material properties, the asperity characteristics as well as the surface topography. Results show that even outside the bonding regime the specific bonding energy is still high enough to cause adhesive problems for microstructures.
Original language | English |
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Title of host publication | International Conference on Computational Nanoscience and Nanotechnology - ICCN 2002 |
Subtitle of host publication | April 21-25, 2002, San Juan Marriott Resort and Stellaris Casino, San Juan, Puerto Rico, USA |
Place of Publication | Cambridge, MA |
Publisher | Computational Publications |
Pages | 326-329 |
Number of pages | 4 |
Volume | 2 |
ISBN (Print) | 0-9708275-6-3 |
Publication status | Published - 21 Apr 2002 |
Event | International Conference on Computational Nanoscience and Nanotechnology, ICCN 2002 - San Juan, Puerto Rico, United States Duration: 21 Apr 2002 → 25 Apr 2002 |
Conference
Conference | International Conference on Computational Nanoscience and Nanotechnology, ICCN 2002 |
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Abbreviated title | ICCN |
Country/Territory | United States |
City | San Juan, Puerto Rico |
Period | 21/04/02 → 25/04/02 |
Keywords
- Adhesion model
- Surface topography
- Bonding energy
- Deformation regime
- Microstructures