Three-layer approach to detect anomalies in industrial environments based on machine learning

Daniel Gutierrez-Rojas, Mehar Ullah, Ioannis T Christou, Gustavo Almeida, Pedro Nardelli, Dick Carrillo, Jean M Sant’Ana, Hirley Alves, Merim Dzaferagic, Alessandro Chiumento

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

7 Citations (Scopus)

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Computer Science